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EMP SUSCEPTIBILITY OF INTEGRATED CIRCUITS

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C. R. Jenkins, D. L. Durgin · 1975

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Electronic circuits have specific electromagnetic failure thresholds, proving that EMF exposure levels matter for device functionality and reliability.

Plain English Summary

Summary written for general audiences

Researchers tested 41 different types of integrated circuits from seven logic families to determine how much electromagnetic pulse (EMP) power it takes to damage them. They found specific failure thresholds for different circuit types and developed a model to predict when untested circuits might fail under EMP exposure.

Why This Matters

While this 1975 study focused on military and industrial applications, it reveals something crucial about our electronic world: integrated circuits have measurable vulnerability thresholds to electromagnetic pulses. The reality is that every electronic device in your home contains these same basic circuit types. What this means for you is that the electronics we rely on daily have inherent electromagnetic sensitivities that manufacturers must account for. The science demonstrates that even brief electromagnetic pulses can cause permanent failure in circuits, which explains why modern devices require extensive EMF shielding and why regulatory limits exist for electromagnetic emissions from everything from cell towers to microwave ovens.

Exposure Information

Specific exposure levels were not quantified in this study.

Cite This Study
C. R. Jenkins, D. L. Durgin (1975). EMP SUSCEPTIBILITY OF INTEGRATED CIRCUITS.
Show BibTeX
@article{emp_susceptibility_of_integrated_circuits_g6096,
  author = {C. R. Jenkins and D. L. Durgin},
  title = {EMP SUSCEPTIBILITY OF INTEGRATED CIRCUITS},
  year = {1975},
  
  
}

Quick Questions About This Study

The researchers tested electromagnetic pulse widths ranging from 0.1 microseconds to 10 microseconds. These extremely brief pulses were sufficient to cause permanent failure in integrated circuits, demonstrating how quickly electromagnetic energy can damage electronic components.
Seven different logic families were represented among the 41 integrated circuit types tested. This broad sampling allowed researchers to identify failure patterns across different circuit designs and technologies used in electronic devices.
Yes, the study developed a simple failure model that can predict the electromagnetic pulse failure thresholds of untested devices. This model uses data from tested circuits to estimate when similar untested circuits might fail.
Failure thresholds depend on the specific logic family and which terminal receives the electromagnetic pulse exposure. The researchers grouped their data by these factors to create meaningful failure categories for different circuit types.
Understanding circuit electromagnetic vulnerability helps explain why modern electronics need EMF shielding and why exposure limits exist. These same basic circuit types are found in smartphones, computers, and household appliances we use daily.