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Measurements of Materials at Ultrahigh Frequencies

Bioeffects Seen

Herman Schwan, Kam Li

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Finding

The foregoing discussion proves, therefore, that the tangent. small sample thickness and open-circuit case. This is the only feasible possibility for determining dielectric properties of material of high dielectric constant.

In their words

“The foregoing discussion proves, therefore, that the tangent. small sample thickness and open-circuit case. This is the only feasible possibility for determining dielectric properties of material of high dielectric constant.”

Exposure Information

A logarithmic frequency spectrum from 10 Hz to 100 GHz showing where this study's 100 MHz to 1 GHz exposure sits relative to common EMF sources.Where This Frequency Sits on the EMF SpectrumELFVLFLF / MFHF / VHFUHFSHFmm10 Hz100 GHzThis study: 100 MHz to 1 GHzPower lines50/60 HzCell phones~1 GHzWiFi2.4 GHz5G mm28 GHzLogarithmic scale

Specific exposure levels were not quantified in this study.

Cite This Study
Herman Schwan, Kam Li (n.d.). Measurements of Materials at Ultrahigh Frequencies.
Show BibTeX
@article{measurements_of_materials_at_ultrahigh_frequencies_g6985,
  author = {Herman Schwan and Kam Li},
  title = {Measurements of Materials at Ultrahigh Frequencies},
  year = {n.d.},
  
  
}
No DOI on file for this study.