NEAR FIELD INSTRUMENTATION
A.W. Rudge, R.M. Knox · 1970
Accurate near field EMF measurement instrumentation, developed in foundational 1970s research, remains essential for assessing modern device exposure levels.
Plain English Summary
This 1970 technical report by Rudge and Knox focused on developing instrumentation methods for measuring electromagnetic fields in the near field region. The research addressed fundamental challenges in accurately measuring radiation patterns close to EMF sources, which is critical for understanding exposure levels from electronic devices.
Why This Matters
This foundational work represents an important milestone in EMF measurement science. In 1970, researchers were already recognizing the need for precise instrumentation to measure electromagnetic fields in the near field region - the area immediately surrounding EMF sources where field patterns are complex and exposure levels can be highest. This is exactly where we spend most of our time with modern devices like cell phones, laptops, and tablets.
What makes this research particularly relevant today is that near field measurements remain challenging even with modern equipment. The instrumentation methods developed in studies like this form the backbone of how we assess EMF exposure from the devices we use daily. Without accurate near field measurement capabilities, we cannot properly evaluate the health implications of our increasingly electromagnetic environment.
Exposure Information
Specific exposure levels were not quantified in this study.
Show BibTeX
@article{near_field_instrumentation_g6558,
author = {A.W. Rudge and R.M. Knox},
title = {NEAR FIELD INSTRUMENTATION},
year = {1970},
}