RADIATION SURVEYS—MEASUREMENT OF LEAKAGE EMISSIONS AND POTENTIAL EXPOSURE FIELDS
David E. Janes, Jr. · 1979
1979 research surveyed actual radiation leakage from electronics, establishing foundational methods for measuring real-world EMF exposure levels.
Plain English Summary
This 1979 technical study by Janes examined radiation leakage from electronic equipment and measured the electromagnetic fields people might be exposed to. The research focused on surveying actual emission levels from various radiofrequency sources to understand potential human exposure scenarios. This type of foundational measurement work helped establish early understanding of EMF exposure levels in real-world environments.
Why This Matters
This 1979 research represents crucial foundational work in EMF exposure assessment, conducted during an era when electronic devices were rapidly proliferating but safety standards were still developing. What makes this study significant is its focus on actual leakage emissions rather than theoretical calculations. The reality is that many electronic devices emit more radiation than their specifications suggest, and this type of survey work helps identify those gaps between design intentions and real-world performance.
The timing of this research is particularly relevant today. In 1979, we had far fewer EMF sources in our environment, yet researchers were already concerned enough about leakage emissions to conduct systematic surveys. Fast-forward to today's environment with smartphones, Wi-Fi routers, smart meters, and countless wireless devices, and you can see why understanding actual emission patterns becomes even more critical for protecting public health.
Exposure Information
Specific exposure levels were not quantified in this study.
Show BibTeX
@article{radiation_surveys_measurement_of_leakage_emissions_and_potential_exposure_fields_g6049,
author = {David E. Janes and Jr.},
title = {RADIATION SURVEYS—MEASUREMENT OF LEAKAGE EMISSIONS AND POTENTIAL EXPOSURE FIELDS},
year = {1979},
}