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Results at the development of one near field strength meter at the measurement of the electrical component of the electromagnetic r.f.-field in the GDR

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Eggert, S., Goltz, S., Kupfer, J. · 1977

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East German researchers developed specialized RF field measurement tools in 1977, highlighting decades-old recognition of EMF assessment needs.

Plain English Summary

Summary written for general audiences

This 1977 East German technical report documented the development of a specialized meter designed to measure the electrical component of radiofrequency electromagnetic fields in near-field conditions. The research focused on creating measurement tools for RF field assessment, representing early technical work in electromagnetic field monitoring capabilities during the Cold War era.

Why This Matters

This technical report represents a fascinating piece of EMF measurement history from behind the Iron Curtain. While we don't have specific findings, the fact that East German researchers were developing specialized near-field RF meters in 1977 tells us something important: concerns about electromagnetic field exposure and the need for accurate measurement tools existed decades before cell phones became ubiquitous. Near-field measurements are particularly relevant because that's where we spend most of our time with modern devices - within inches of our phones, tablets, and WiFi routers.

The focus on measuring the electrical component specifically is noteworthy because many early EMF studies concentrated primarily on magnetic fields. This technical development work laid groundwork for the measurement capabilities we rely on today to assess EMF exposure from the devices that now surround us constantly. The science demonstrates that accurate field measurement remains as crucial now as it was in 1977, perhaps more so given our exponentially increased exposure levels.

Figures from the Original Paper

Diagrams extracted from the original research document.

diagramPage 7 - AI-described figure: Figure/Slide 2 depicts a diagram showing an electronic device with various components and connections.
diagramPage 9 - AI-described figure: Figure/Slide 4 depicts a person in formal attire holding an object.
diagramPage 10 - AI-described figure: Figure/Slide 5: Circuit diagram with resistors (R1, R5, R6), capacitors (C1), diodes (D1), and a switch (St1).

Exposure Information

A logarithmic frequency spectrum from 10 Hz to 100 GHz showing where this study's 60 kHz to 350 MHz exposure sits relative to common EMF sources.Where This Frequency Sits on the EMF SpectrumELFVLFLF / MFHF / VHFUHFSHFmm10 Hz100 GHzThis study: 60 kHz to 350 MHzPower lines50/60 HzCell phones~1 GHzWiFi2.4 GHz5G mm28 GHzLogarithmic scale

Specific exposure levels were not quantified in this study.

Study Details

To develop a near field strength meter for measuring the electrical component of electromagnetic fields in high-frequency working places

Designed a near field strength meter (NFM 1) with two dipole probes for frequency ranges 60 kHz to 3...

The NFM 1 meter was tested at about 200 working places with high-frequency exposure, including indus...

The NFM 1 meter proved suitable for optimizing screening devices and checking their screening effect. It is suited for measuring electrical field strength at high-frequency working places with good local separability of complicated field configurations. The meter was used for epidemiological investigations and to estimate exposure of operating staff.

Cite This Study
Eggert, S., Goltz, S., Kupfer, J. (1977). Results at the development of one near field strength meter at the measurement of the electrical component of the electromagnetic r.f.-field in the GDR.
Show BibTeX
@article{results_at_the_development_of_one_near_field_strength_meter_at_the_measurement_o_g6414,
  author = {Eggert and S. and Goltz and S. and Kupfer and J.},
  title = {Results at the development of one near field strength meter at the measurement of the electrical component of the electromagnetic r.f.-field in the GDR},
  year = {1977},
  
  
}
No DOI on file for this study.

Quick Questions About This Study

Near-field measurement captures electromagnetic fields very close to the source, typically within one wavelength distance. This is crucial because most human EMF exposure occurs in near-field conditions when using phones, tablets, and other wireless devices held close to the body.
Electromagnetic fields have both electrical and magnetic components that can affect biological systems differently. Measuring the electrical component specifically helps researchers understand one key aspect of how RF energy interacts with human tissue and cellular processes.
East German scientists were developing EMF measurement tools during the Cold War era, suggesting international recognition of electromagnetic field effects. This research occurred decades before widespread public concern about cell phone radiation and wireless technology health impacts.
While modern instruments are more sophisticated, the fundamental principles of near-field RF measurement established in research like this remain relevant. Today's EMF meters still need to accurately capture electrical field components near wireless devices and transmission sources.
Standard measurement equipment often fails in near-field conditions because electromagnetic fields behave differently very close to sources. Specialized meters account for field variations, coupling effects, and measurement interference that occur at close distances to RF sources.